To complete EVG’s lithography and bonding portfolio, sufficient metrology is necessary to ensure process control and (in combination with feedback loops) also allow for process parameter optimization like bond alignment. Versatile measurement options are available to meet the metrology requirements for a wide variety of applications. These tools can fit in HVM and R&D environments.
Metrology is essential to control, optimize and ensure the highest yield in semiconductor manufacturing processes. Advanced packaging, MEMS and photonic applications are gaining importance, very often lacking suitable metrology solutions for essential processing steps. Furthermore, overall performance of the device is determined by packaging and back-end-of-line processes; hence, process requirements are getting tighter and need further metrology. EVG’s metrology solutions for wafer inspection and evaluation are optimized for lithography and all types of bonding applications. As one example, metrology prior to non-reworkable processes like wafer thinning after temporary bonding directly leads to increased yield and process security, where an integrated feedback loop results in a reduction of high-cost wafer scrap.
Listen to our talk "Hybrid Wafer-to-Wafer and Die-to-Wafer Technology for Heterogenous Integration Applications" held by Dr. Dragoi in Symposium VII: Packaging and Assembly.
Meet EVG at booth #3131 at SEMICON China 2024!
Listen to our Talk "Unlocking New Possibilities: Nanoimprint Lithography for AR/VR/XR Waveguide Fabrication" held by Senior Process Technology Engineer Schuster Patrick on March, 29 at the eXtended Reality Korea.
Contact the EVG experts