Eutectic bonding, also called eutectic soldering, is where the combination of two or more metals allow direct transformation from solid to liquid state or vice versa at specific temperature without passing two-phase equilibrium. The eutectic temperature is much lower than the melting temperature of the materials that are involved in the bonding process. Eutectic bonding is ideal for high-vacuum applications as this process has very low outgassing.
Eutectic wafer bonding is widely used in the MEMS industry for hermetic sealing, pressure or vacuum encapsulation as it allows highly reliable wafer-level processing for devices with the smallest form factors. The most common metals/alloys that are used in eutectic bonding are Al-Ge, Au-Sn and Au-In. However, there are many other material combinations available that can produce a eutectic bonding system. Additionally, the ability of silicon to alloy with metals like Au can also be the basis for eutectic bonding. All eutectic bonds must go through a liquid phase and thus are less sensitive to surface flatness irregularities, scratches and particles, thereby facilitating high volume manufacturing. Bonding temperature, time and pressure are the most important parameters for eutectic bonding where high bond strength can be achieved with low processing temperature and minimum resultant stress. Eutectic bonding can additionally enable hermetic sealing and electrical interconnections in a single process. Compared to other intermediate layers, such as adhesives or glass-frit, eutectic bonding also promotes better out-gassing and hermeticity.


Listen to our Keynote “Advancing AR/VR and CPO: EV Group’s Inkjet Solutions for Next-Generation Optics” held byJohanna Rimböck (Technology Development).
For more information about the program click here.

Visit our Booth #2 & listen to our talks:
"Scalable Manufacturing Approaches for Co-Packaged Optics via NIL and Advanced Wafer Bonding" held by Director Business Development Dr. Bernd Dielacher.
“Advancing 310×310 mm² Panel Level Packaging: High Throughput Pathways to High Yield 3D Integration” and “Plasma–Enabled Die Singulation on Film Frame Carrier for Advanced HBM and Logic Die Integration” by Business Development Manager Dr. Ksenija Varga.
“Hybrid Bonding Overlay Reduction Through Lithographic Pre-Compensation of the Residual Fingerprint” by Technical Program Manager Sander Grosemans.
EVG & Brewer Science: “Polymer Buffer Layer Enabling a Novel RDL–First Process Flow using a Silicon Carrier and IR Laser Debonding Technology” shared presentation, Peter Urban & Brewer Science.
EVG & CEA–Leti: “Nanometer Level Chip- Scale Transfer Enabled by IR Laser Debond Technology”.
Check out the program here.
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