Spin coating technology is a universal and intensively used process for applying uniform thin films when no topography on the wafer is considered.
Dosing accuracy of dispensed material and spin speed are some of the most important factors in spin coating processes. Other critical process parameters such as acceleration, precise positioning or possibility to perform a dynamic dispense rate also play a significant role in coat properties. EVG spin coaters are designed to control all of these critical parameters to ensure precise resist dispensing process control. Up to eight dispense lines without temperature control or up to four temperature-controlled dispense lines enhance process set-up supporting three different dispense modes to guarantee optimum results for an extensive range of resists with viscosities up to 52.000 cP. Static or dynamic center dispense mode is recommended for typical thin-film applications and standard viscosity. Area dispense mode optimizes uniformity and resist consumption by enabling extremely uniform thick resist layers for the use of high-viscosity resists like BCB or SU-8. Moreover, edge dispense mode is a typical application for etch protection purposes, especially for long-term etch processes. For this purpose, EVG systems are equipped with programmable swivel arms supporting various flat/notch designs. Additional functions – such as solvent-based pre-wetting, edge-bead removal and automatically solvent refillable sealed park position – support advanced process control and production requirements. The programmable suck-back function prevents surplus resist from dropping out of the nozzle tip on the wafer surface and thus secures conformal results throughout the whole wafer. Optional CoverSpin reduces the amount of resist material per wafer and avoids edge turbulence effects independent of the substrate shape. Overall, EVG’s spin coat module with a simulation-based low-turbulence design effectively supports resist-saving processes while providing high-uniformity results on planar or low-topography surfaces.

Treffen Sie das EVG-Team am Stand #B1241 und besuchen Sie unsere Poster-Präsentation auf der APC:
"High Throughput Digital Lithography Development for 3D Device Integration" von Business Development Manager Dr. Ksenija Varga.

Besuchen Sie unseren Stand auf der Internationalen Wafer Bonding Konferenz und hören Sie sich unsere Talks an:
"Impact of Surface Condition on In-Plane Distortion in Si Wafer Bonding: Correlation with Adhesion Energy and Bondwave Propagation Speed" von Technology Development Dr. Christoph Flötgen.
“Advanced IR Laser Debonding on Silicon Wafers for RDL- first FOWLP” von Supervisor Process Technology Peter Urban.
“D2W Bonding of III-V and piezo electrical materials for Heterogeneous Integration” von Team Leader Process Technology Mariana Pires.
“Comprehensive Bond strength optimization of LiTaO3 bonding using ComBond Technology” von Supervisor Process Technology Michael Dornetshumer.
“ComBond Bonding of Diamond and other Materials for Advanced Thermal Management” von Senior Process Technology Engineer Matthias Danner.
und besuchen Sie die Poster Presentation, wo wir mit folgendem Thema vertreten sind:
“Comparative Analysis of Atmospheric and ComBond-Activated TiTi thermos-compression Bonding” von Team Leader Process Technology Thomas Stöttinger.

Besuchen Sie unseren Stand #20 & hören Sie sich unsere Vorträge an:
"The Critical Role of Wafer Bonding in Next-Generation Interconnect Scaling" gehalten von Team Leader Business Development Dr. Bernd Dielacher und
“Innovation and Efficiency in 3D Packaging Enabled by Optimized Integration Processes” von Business Development Manager Dr. Ksenija Varga.
Contact the EVG experts