Transient Liquid Phase (TLP) bonding is often used when high-reliability bond lines or electric connections are needed. In this process, the interlayer melts, and the interlayer element diffuses into the substrate materials, thereby causing isothermal solidification. This results in a bond that has a higher melting point than the bonding temperature.
The unique characteristic feature of Transient liquid phase (TLP) bonding is that the liquid bond interface solidifies by diffusion but not by cooling below a melting point compared to eutectic bonding. This enables low process temperatures while providing much higher remelt temperature after joining the wafers. In particular, the interlayer is a low melting point material that moves into the lattice and grain boundaries of the high melting point parent materials, thereby forming an inter-metallic layer. In TLP, it is important to select a suitable interlayer based on the flow characteristics, stability and wettability in order to form a composition that provides faster diffusion characteristics and high reliability. Compared to other bonding technologies, TLP is an advanced type of solder bonding method that can form hermetic sealing at lower temperatures. It is ideal for MEMS vacuum packaging, as the process can be performed at low temperatures compatible with CMOS standards and the resulting bonded devices can withstand harsh environments with high temperatures.

Treffen Sie das EVG-Team am Stand #B1241 und besuchen Sie unsere Poster-Präsentation auf der APC:
"High Throughput Digital Lithography Development for 3D Device Integration" von Business Development Manager Dr. Ksenija Varga.

Besuchen Sie unseren Stand auf der Internationalen Wafer Bonding Konferenz und hören Sie sich unsere Talks an:
"Impact of Surface Condition on In-Plane Distortion in Si Wafer Bonding: Correlation with Adhesion Energy and Bondwave Propagation Speed" von Technology Development Dr. Christoph Flötgen.
“Advanced IR Laser Debonding on Silicon Wafers for RDL- first FOWLP” von Supervisor Process Technology Peter Urban.
“D2W Bonding of III-V and piezo electrical materials for Heterogeneous Integration” von Team Leader Process Technology Mariana Pires.
“Comprehensive Bond strength optimization of LiTaO3 bonding using ComBond Technology” von Supervisor Process Technology Michael Dornetshumer.
“ComBond Bonding of Diamond and other Materials for Advanced Thermal Management” von Senior Process Technology Engineer Matthias Danner.
und besuchen Sie die Poster Presentation, wo wir mit folgendem Thema vertreten sind:
“Comparative Analysis of Atmospheric and ComBond-Activated TiTi thermos-compression Bonding” von Team Leader Process Technology Thomas Stöttinger.

Besuchen Sie unseren Stand #20 & hören Sie sich unsere Vorträge an:
"The Critical Role of Wafer Bonding in Next-Generation Interconnect Scaling" gehalten von Team Leader Business Development Dr. Bernd Dielacher und
“Innovation and Efficiency in 3D Packaging Enabled by Optimized Integration Processes” von Business Development Manager Dr. Ksenija Varga.
Kontaktieren Sie die EVG-Experten