The SmartView NT automated bond alignment system for universal alignment offers a proprietary method for micron-level face-to-face wafer-level alignment. This alignment technique is key to achieving the required accuracy in multiple wafer stacks for leading-edge technologies. The tool is well suited for applications such as wafer stacking for 3D interconnects, wafer-level-packaging and high-volume MEMS devices.
| Substrate / Wafer parameters |
|---|
| Size: 150 - 200, 200 - 300 mm |
| Thickness: 0,1 - 5 mm |
| Max. stack height: 10 mm |
| Automatic alignment |
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| Standard |
| Handling system |
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| 3 cassette stations (up to 200 mm) or 2 FOUP load ports (300 mm) |

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